In this section you can take a virtual tour through the Spectano Analyzer Suite and explore the functionalities of the SPECTANO 100. Feel free to click on the screenshots to get an enlarged view of the Spectano Analyzer Suite screens.
The Frequency Domain Spectroscopy (FDS) allows fast measurements at high frequencies but requires long measurement times at lower frequencies. Due to the FDS frequency range from 5 µHz to 5 kHz and its high voltage output range up to 200 Vpeak, the SPECTANO 100 is ideally suited to analyze both – slow and fast – dielectric phenomena in solid and liquid insulating materials.
The SPECTANO Analyzer Suite provides visualizes the dielectric loss (tanδ), relative permittivity εr, capacitance, impedance and phase in various charts including the Cole-Cole diagram.
For faster measurements at lower frequencies the SPECTANO 100 system provides the Polarization Depolarization Current (PDC) or Combined (FDS and PDC) method.
The SPECTANO 100 test system offers a high precision time domain current measurement the - Polarization Depolarization Current method (PDC).
This measurement has a high current resolution and accuracy of 0.5 % ±1 pA, which is very suitable for dielectric solid and liquid insulating materials. For the PDC method, a DC voltage up to max. 200Vpeak is applied to the device under test for a specific time and the polarization Ipol current is measured.
Together with the SPECTANO 100 Analyzer Suite it is possible to evaluate the dielectric response and to display the dielectric frequency domain characteristics from the polarization current data using Fourier transformation. Furthermore, the suite offers the possibility to record and display the depolarization current Idepol. The PDC method is faster than the FDS at very low frequencies. The PDC test frequency range is 20 μHz to 100 mHz.
By combining the PDC and FDS principle the test time can be significantly reduced for measurements covering low and high frequencies at the same time. In the combined mode the PDC method is used to acquire data for frequencies below
100 mHz in the time domain and the FDS method for measurements above 100 mHz.
Depending on the selected frequency range this reduces the measurement time up to 50 % - 75 % compared to exclusive FDS measurements.
The SPECTANO 100 Analyzer Suite provides models for various test cell types with cylindrical electrodes and disks electrodes. These models cover different material test applications according to international standards like ASTM D150 or IEC 60250 to calculate the vacuum capacitance C0 and the relative material permittivity εr automatically.
The purpose of a reference measurement is to eliminate parasitic capacitances such as stray capacitances or capacitances between the leads and ground and to compensate any measurement offset.
The SPECTANO 100 Analyzer Suite provides this type of measurement and algorithms according to international standards like ASTM D150 or IEC 60250 to correct the measured material values automatically. This correction is displayed in the graph view and can be toggled on and off at any time.
The SPECTANO 100 Analyzer Suite offers the possibility to create sophisticated measurements by flexible measurement sequence programming. Up to 10 measurements can be added to one file. Together with the sequence programming option, this feature allows to execute different measurements in one test file and to add waiting times between the measurements.
This allows for example dielectric material measurements at different temperatures to investigate curing processes in a temperature controlled environment. Other applications are measurements with different sample thicknesses or at different output voltages.
The SPECTANO 100 Analyzer Suite provides different pre-measurements to check the test system before starting a measurement. Errors in the system or settings can be detected immediately and not at the end of a several hours measurement. This saves time and money.
To understand and optimize your material under test, the SPECTANO 100 Analyzer Suite offers high number of chart formats in the frequency domain, the time domain or Cole-Cole plots.
This allows you to analyze results like relative permittivity εr, impedance, dielectric loss tanδ, power factor and capacitance over frequency. Further on the polarization and depolarization current can be analyzed over time.
You can extract all required results and parameters from your measurements or compare different measurements using a variety of analysis features.
The SPECTANO 100 Analyzer Suite helps you to easily extract measurement results for documentation. You can export, share and archive your results by:
- Exporting the results and settings into *.csv file
- Saving your entire measurements, including the device settings, to a SPECTANO 100 Analyzer Suite file (*.spt), which can be viewed on any Windows® PC having the SPECTANO 100 Analyzer Suite installed.
The clone measurement function allows a fast preparation of test files with measurements, which vary for example only in one parameter. This leads into an outstanding reduction of test file preparation time.
The SPECTANO 100 Analyzer Suite offers two different functionalities to prevent data loss before the test file has been saved:
- Load results from device to test file (automatically and manually)
- Back-up file saved on the hard disk
The SPECTANO Analyzer Suite can be downloaded for free in the downloads section.